- Running Burn-in test
Preliminary fast test:
1. Open two windows on sdfsg2 with
username: tracker
password: *******
2.Inthe first window: cd tb (for sdvme2) or
cd vme9 (for sdvme9)
3. In the second window: telnet sdvme2 or (telnet
sdvme9)
username: vxworks
password: *******
cd "~tracker/tb" or cd "~tracker/vme9"
ld < adc_mon (for sdvme9 only)
4. In the first window: dl_long.tcl & >>> SVX
Download Panel window pops up
5. On SVX Download Panel push buttons:
Init VRB
Reset SARC
Idle_f_dl
Pt card4 (for sdvme2) or
Pt card1 (for sdvme9)
Download Portcard
Cancel
SVX4 (sdvme2) or
SVX1 (sdvme9) >>> Select
chain 1 or chain
2
Create download file with
the parameters listed in the window and the given filename.
Important notice:
If the devices
are connected to both chains make sure that chip ID's in download files you
created for chain 1 and chain 2 are different. In long term test chip Id's for
chain 1 start from 0x90, for chain 2 - from 0xf0.
Download SVX >>> make
sure that no error messages appeared in sdvme window. For detalis on assigning
SVX chip parameters in download file see Downloading
SVX chip
Cancel
8. Put number of events to run and datafile name
9. Push cal run
10. For convenience, convert raw data into ascii file:
- cd tb or cd vme9
- convert raw_filename ascii_filename
11. Look at the data to make sure that it is ok. You should
be able to read proper chip Id's and channel numbers from 0 to 127 for
read all mode for each chip.
Long term test:
1. Push long test button >>>
Long term test panel shows up
2. On Long term test panel put:
Number of runs
Delay between runs
Device name (under
certain Port card and chain)
Number of chips on the device
Detector side (p
or n)
3. Press Start button
The chain labels on Long term test main panel corresponding to the devices
under test will change their color to red. Run information will appear
in the text window as well as in Run information
windows.
4. Press Stop button to
interrupt the long term test
- Modifying the device list
during the long term test :
In sdfsg2 window: devlist.tcl &
>>> Device panel for burn-in test shows up
Get - to get the list of
devices under test
Stop - to stop burn-in test
for a particular device
Run - to start burn-in test
for a new device
Update - get the current
device list
Get Params - to get currents,
temperature and power consumption (under development)
To interrupt burn-in test for a particular
device press Stop
button under device name.
To start a new device:
- Put device name, number of chips, detector
side
- Press Run
- Long term test output:
The output of the long term test is stored in directory /disk2_3/dzero/burn_in/results/devname
and contains the following information.
- Raw data files: devname_mipi_maskj_runk.raw,
where i =1,...4 - injected charge
value, j=1,...8 - mask number,
k - run number, devname
- device name. Important notice:
If the devices are connected to two chains raw data file contains data for both
devices. If you are interested in data for device devname connected to chain 1 you should
look at the data corresponding to chip Id's 90, 91, ... in devname directory and disregard data for chip
Id's f0, f1, ... On the contrary to look at the data for device connected to
chain 2 select chip Id's f0, f1, ... in the corresponding directory
- Histograms (ascii files) for pedestals: devname_ped_runk.hist
(devname_ped_runk.dat, example
)
- Histograms (ascii files) for gains: devname_gain_runk.hist
(devname_gain_runk.dat, example
)
- Additional histograms and fits: devname_fits_maskj_runk.hist
- General information about the test: burn.log
- Data from ADC monitor: paramlist.dat
To look at the histograms:
cd /disk2_3/dzero/burn_in/results/device_name
pawX11
exec burn_in#plotped <number of chips> <device name>
<run number> - to plot pedestals, example
exec burn_in#plotgain <number of chips> <device name>
<run number>- to plot gains, example
exec burn_in#compareped <number of chips> <device name>
<run1> <run2> <run3>- to compare pedestals for
up to three runs
exec burn_in#comparegain <number of chips> <device name>
<run1> <run2> <run3> - to compare gains for up
to three runs
Questions or suggestions send to:
Data acqusition:
Dave Buchholz - dave@nuhepg.phys.nwu.edu
Ling-Jun Pan - panlj@nuhpz.phys.nwu.edu
Burn-in specific
software: Lisa
Chabalina - elis@fnal.gov
hardware: Sasha Leflat - leflat@fnal.gov