SMT_EXAMINE histograms:
SMT_EXAMINE histograms
MODES:
- FULL – histos for all barrels, f-disks or h-disks.
- SELECTED – user defined configuration.
- ACCUMULATE – accumulate ADC counts as events are processed
- NON-ACCUMULATE - show histos for each event.
- STATIC – substract a fixed pedestal for all events
- DYNAMIC – event-by-event pedestal substaction
- CHIPS – chip level histograms.
- SP_READOUT – histos for sparse readout mode only
Ladder/wedge level histos:
- str – pedestal distribution
- ent – number of entries
- avg – average pedestal height distribution
- fired – number of fired strips per ladder/wedge
- pls – pulse height distribution
- std – standart deviation distribution
Chip level histos:
- pls – pulse height distribution
- avgped – average pedestal distribution
- avgped/event – average pedestal versus event
AVAILABLE MODES:
ACCUMULATE:
- FULL/STATIC – str,ent,avg,fired
- FULL/STATIC/SP_READOUT – str,ent,avg,fired (MC mode)
- SELECTED/DYNAMIC, SELECTED/STATIC – str,end,avg,fired,pls,std
- SELECTED/DYNAMIC/SP_READOUT, SELECTED/STATIC/SP_READOUT – str,ent,avg,fired
- SELECTED/STATIC/CHIPS – str,ent,avg,fired,pls,std + chip level histos. (10% test mode)
- SELECTED/STATIC/CHIPS/SP_READOUT – str,ent,avg,fired + chip level histos (MC mode)
NON-ACCUMULATE:
- SELECTED/STATIC – str
- SELECTED/STATIC/CHIPS – str + chip level histos.
Alex Koubarovski
Last modified: Mon Nov 20 11:51:22 CST 2000